The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Mar. 03, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Takayuki Sugiura, Ota, JP;

Akihito Seki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 60/00 (2020.01); G06T 7/73 (2017.01); G06V 20/56 (2022.01); G06F 18/2431 (2023.01);
U.S. Cl.
CPC ...
B60W 60/00272 (2020.02); G06F 18/2431 (2023.01); G06T 7/73 (2017.01); G06V 20/56 (2022.01); B60W 2420/42 (2013.01); G06T 2207/30252 (2013.01);
Abstract

According to an embodiment, an information processing device includes one or more processors. The processors are configured to: acquire a plurality of pieces of detection information including detection results at two-dimensional positions different from each other acquired by detection of an object by one or more detection devices through a transmission body, the plurality of pieces of detection information including distortion due to the transmission body that exists between the detection devices and the object; detect a feature point from each of the plurality of pieces of detection information; and estimate, by minimizing an error between a three-dimensional position corresponding to the feature point and a detection position of the feature point corrected based on a distortion map expressing distortion at each of the two-dimensional positions, the distortion map, the three-dimensional position, and the detection position.


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