The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Feb. 14, 2020
Dietmar W Kramer, Auslikon, CH;
Dietmar W Kramer, Auslikon, CH;
Abstract
In a method for measuring or calibrating utensils, in particular in pressing processes, different dimensions and/or positions of the utensils, such as tools, stamps, die units, chucks or the like, are determined. A measuring device is provided, with which the utensils are placed relative to one another in the press as in the installed state and are displaceable relative to one another at least in the axial direction of the opening in the die unit forming the die and are measured and/or calibrated individually and relative to one another. The pressed parts and workpieces to be produced using a press can thus be manufactured in a highly precise manner, moreover in high numbers using the same utensils.