The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Jul. 15, 2020
Applicant:
Meso Scale Technologies, Llc., Rockville, MD (US);
Inventors:
Gary I. Krivoy, Rockville, MD (US);
Cecilia Zimmerman, Clarksburg, MD (US);
Jules Vandersarl, Gaithersburg, MD (US);
Sandor Kovacs, Middletown, DE (US);
Aaron H. Leimkuehler, Upper St. Clair, PA (US);
Leo Tabakin, Germantown, MD (US);
Jon Willoughby, Gaithersburg, MD (US);
Manish Kochar, Rockville, MD (US);
Charles M. Clinton, Clarksburg, MD (US);
Assignee:
MESO SCALE TECHNOLOGIES, LLC., Rockville, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 9/00 (2006.01);
U.S. Cl.
CPC ...
B01L 9/523 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/168 (2013.01); B01L 2300/1844 (2013.01); B01L 2300/1894 (2013.01);
Abstract
Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. The apparatuses, systems, method, reagents, and kits may be employed in conducting automated analysis in a multi-well plate assay format.