The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jun. 19, 2018
Applicant:

Sumitomo Metal Mining Co., Ltd., Tokyo, JP;

Inventors:

Hirofumi Tsunematsu, Isa, JP;

Takeshi Chonan, Isa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01G 13/02 (2006.01); C01G 41/02 (2006.01); C09C 3/06 (2006.01); C08J 7/04 (2020.01);
U.S. Cl.
CPC ...
A01G 13/0275 (2013.01); C01G 41/02 (2013.01); C08J 7/0427 (2020.01); C09C 3/063 (2013.01); C01P 2002/30 (2013.01); C01P 2002/72 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); C01P 2006/90 (2013.01);
Abstract

An agricultural and horticultural film that does not raise a temperature of an atmosphere such as a greenhouse by using the agricultural and horticultural film in the greenhouse, etc., while absorbing infrared rays from the sunlight and warming the soil, the film having an infrared absorbing layer containing infrared absorbing material ultrafine particles, wherein the infrared absorbing material ultrafine particles are composite tungsten oxide ultrafine particles, and the composite tungsten oxide ultrafine particles have a XRD peak top intensity ratio value of 0.13 or more based on an XRD peak intensity ratio value of 1 on plane of a silicon powder standard sample (640c produced by NIST).


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