The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Feb. 13, 2020
National University Corporation Chiba University, Chiba, JP;
Non Profit Organization Japan Plant Factory Association, Kashiwa, JP;
Yumiko Amagai, Kashiwa, JP;
Alexander Feldman, Kashiwa, JP;
Yu Zhang, Kashiwa, JP;
Tomomi Nozaki, Kashiwa, JP;
Toyoki Kozai, Kashiwa, JP;
Eri Hayashi, Kashiwa, JP;
Osamu Nunomura, Kashiwa, JP;
Rikuo Hasegawa, Kashiwa, JP;
Abstract
The invention tracks and automatically evaluates plant traits of 'individuals of plant canopy' in a growth process of a germination period (from sowing until immediately prior to primary seedling culture), at a plant factory with artificial lighting. Specifically, a two-dimensional distribution of the plant traits is calculated by non-destructively and continuously measuring plant trait information in the growth process of the germination period, on the basis of image information, environmental factor information, genetic characteristic information, and management information. In addition, physiological performance reactions of the individuals of plant canopy cultivated in an environmentally-controlled closed space are continuously measured, and measurements are continuously taken of the two-dimensional distribution of the environmental factor information, and items such as temperature, vapor pressure deficit, nutrient solution percentage, nutrient solution temperature, pH, and electric conductivity.