The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Dec. 21, 2021
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventor:

Hua-Ling Cynthia Hsu, Fremont, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/04 (2006.01); G11C 16/24 (2006.01); G06F 11/10 (2006.01); G11C 11/56 (2006.01); H01L 25/065 (2023.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G06F 11/1068 (2013.01); G11C 16/0483 (2013.01); G11C 16/24 (2013.01); G11C 11/5671 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06562 (2013.01);
Abstract

A non-volatile memory combines a hard bit and a soft bit read into a single, efficient soft sense sequence by using two sense per state level to improve read time efficiency. Rather than a standard hard bit read, where two soft bit reads are performed, offset above and below the hard bit read value, the hard bit read is shifted so that it reliable senses one state but less reliably senses the other state and soft bit data is only determined for the less reliably sensed state. This reduces the amount of soft bit data. The efficient soft sense sequence can be used as a default read mode, providing soft bit information for ECC correction without triggering a read error handling flow. Merging the soft bit and hard bit sense into one sequence can avoid extra overhead for read sequence operations.


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