The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

May. 20, 2021
Applicant:

Abbyy Development Inc., Dover, DE (US);

Inventors:

Ivan Zagaynov, Moscow Region, RU;

Dmitry Rodin, Saratovkaya, RU;

Vasily Loginov, Moscow, RU;

Assignee:

ABBYY Development Inc., Dover, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/98 (2022.01); G06V 10/50 (2022.01); G06N 20/00 (2019.01); G06N 5/04 (2023.01); G06V 10/32 (2022.01); G06V 30/10 (2022.01); G06F 18/214 (2023.01); G06F 18/21 (2023.01); G06V 10/80 (2022.01);
U.S. Cl.
CPC ...
G06V 10/993 (2022.01); G06F 18/214 (2023.01); G06F 18/2163 (2023.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06V 10/32 (2022.01); G06V 10/50 (2022.01); G06V 10/806 (2022.01); G06V 30/10 (2022.01);
Abstract

Aspects of the disclosure provide for systems and processes for assessing image quality for optical character recognition (OCR), including but not limited to: segmenting an image into patches, providing the segmented image as an input into a first machine learning model (MLM), obtaining, using the first MLM, for each patch, first feature vectors representative of a reduction of imaging quality in a respective patch, and second feature vectors representative of a text content of the respective patch, providing to a second MLM the first feature vectors and the second feature vectors, and obtaining, using the second MLM, an indication of suitability of the image for OCR.


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