The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Mar. 26, 2021
Sintokogio, Ltd., Nagoya, JP;
Kazuhiro Ota, Toyokawa, JP;
Takeshi Sonohara, Toyokawa, JP;
Hiroki Matsuoka, Toyokawa, JP;
Takehiro Sugino, Toyokawa, JP;
SINTOKOGIO, LTD., Aichi, JP;
Abstract
Provided is a technique that allows an operator or the like to easily perceive a tendency of defects which are present in molds or patterns. A display device displays a result of inspection of a plurality of molds or a plurality of patterns which are inspection target objects. The display device classifies the inspection target objects into a plurality of groups, generates, for each of the plurality of groups, a heat map image from a result of defect inspection of one or more of inspection target objects which are classified into the each of the plurality of groups, the heat map image representing a spatial distribution of defect occurrence frequencies; and causes a display to display one or more of the heat map images generated, the one or more heat map images corresponding to one or more groups specified by a user from among the plurality of groups.