The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Jun. 12, 2019
Borealis Ag, Vienna, AT;
Davide Tranchida, Linz, AT;
Klaus-Juergen Buchmann, Linz, AT;
Bhawna Kulshreshtha, Vienna, AT;
Denis Yalalov, Stenungsund, SE;
Borealis AG, Vienna, AT;
Abstract
The present invention is directed to a method for quantitative and qualitative evaluation of laser printed samples, the method comprising the following steps: a) providing (S1) a laser printed sample, b) capturing (S2) a digital raster image of the laser printed part of the laser printed sample and thereon providing digital image information that constitutes the digital raster image, c) identifying (S3) at least one distinct part within the digital image information, d) obtaining at least one image histogram for the identified at least one distinct part of the digital image information, e) fitting (S4) a probability density function on the obtained at least one image histogram, and f) determining (S5) at least one parameter of the probability density function.