The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Jun. 11, 2018
Applicant:
Nikon-trimble Co., Ltd., Tokyo, JP;
Inventor:
Yuichi Ohshima, Kawasaki, JP;
Assignee:
NIKON-TRIMBLE CO., LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01); G01C 15/00 (2006.01); G01N 21/88 (2006.01); G03B 15/00 (2021.01); G01C 11/02 (2006.01); G06T 1/00 (2006.01); H04N 23/69 (2023.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01B 11/24 (2013.01); G01B 11/30 (2013.01); G01C 11/02 (2013.01); G01C 15/00 (2013.01); G01N 21/88 (2013.01); G01N 21/8851 (2013.01); G03B 15/00 (2013.01); G06T 1/00 (2013.01); G06T 5/006 (2013.01); G06T 5/50 (2013.01); H04N 23/69 (2023.01); G01C 11/025 (2013.01);
Abstract
A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.