The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Nov. 16, 2020
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Pablo Navarrete Michelini, Beijing, CN;

Wenhao Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06N 3/08 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06T 3/4076 (2013.01); G06T 3/4046 (2013.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The disclosure provides an image reconstruction method for an edge device, an electronic device and a storage medium. The image reconstruction method includes: extracting low-level features from an input image of a first scale to generate first feature maps, the first feature maps having a second scale greater than the first scale as compared with the input image; extracting low-level features from the input image to generate second feature maps, the second feature maps having the second scale; generating mask maps based on the second feature maps; generating intermediate feature maps based on the mask maps and the first feature maps, the intermediate feature maps having the second scale; synthesizing a reconstructed image having the second scale based on the intermediate feature maps. This method facilitates to achieve a better image super-resolution reconstruction effect with lower resource consumption.


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