The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Dec. 08, 2020
Applicant:

Aon Risk Services, Inc. of Maryland, New York, NY (US);

Inventor:

David Craig Andrews, Carnation, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/10 (2023.01); G06F 40/253 (2020.01); G06F 40/211 (2020.01); G06F 40/117 (2020.01); G06F 40/279 (2020.01); G06F 16/93 (2019.01); G06F 16/2457 (2019.01); G06Q 50/18 (2012.01); G06N 20/00 (2019.01); G06Q 50/26 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/10 (2013.01); G06F 16/24578 (2019.01); G06F 16/93 (2019.01); G06F 40/117 (2020.01); G06F 40/211 (2020.01); G06F 40/253 (2020.01); G06F 40/279 (2020.01); G06Q 50/184 (2013.01); G06F 2216/11 (2013.01); G06N 20/00 (2019.01); G06Q 50/26 (2013.01);
Abstract

Systems may evaluate a claim or patent with respect to a related set of claims or patent documents. The systems may perform linguistic analyses of claims included in the patent and the related set of patent documents. Based on the linguistic analyses, the systems may identify claim limitations, and/or claim elements. The systems may generate a claim profile for each claim being evaluated. The claim profile may include ratings or scores for various metrics related to the claims being evaluated. The systems may also generate a peer group profile that provides an overall measure of metrics for claims included in a peer group of patent documents.


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