The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Feb. 12, 2021
Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;
Changyu Hsieh, Guangdong, CN;
Yuqin Chen, Guangdong, CN;
Yicong Zheng, Guangdong, CN;
Kaili Ma, Guangdong, CN;
Shengyu Zhang, Guangdong, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Guangdong, CN;
Abstract
This disclosure describes a quantum noise process analysis method, device, and storage medium, in the field of quantum processing technologies. The method may include performing quantum process tomography (QPT) on a quantum noise process of a target quantum system, to obtain dynamical maps of the quantum noise process, wherein the QPT involves at least one measurement of the target quantum. The method further includes extracting transfer tensor maps (TTMs) of the quantum noise process from the dynamical maps; and analyzing the quantum noise process according to the TTMs. The TTM is used for representing a dynamical evolution of the quantum noise process to reflect the law of evolution of the dynamical maps of the quantum noise process over time. As a result, richer and more comprehensive information about the quantum noise process can be obtained by analyzing the quantum noise process based on the TTM of the quantum noise process than by pure QPT, thereby achieving a more accurate and more comprehensive analysis of the quantum noise process.