The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Jan. 30, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yohei Tanno, Tokyo, JP;

Yuuki Shimizu, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0248 (2013.01); G05B 23/027 (2013.01);
Abstract

Personal dependency related to fault tree construction is reduced, and the reliability of an operating machine is improved by improving the accuracy of a fault diagnosis. The present invention provides a fault diagnosis device for a machine in operation, the device comprising: an abnormality degree analysis unit that calculates the abnormality degree of each component configuring the machine by comparing input/output data of the machine with a threshold value; a fault tree automatic generation unit that holds a fault tree of each component in which the fault of each component and the fault of a sensor in each component are associated with each other and generates the fault tree of the entire machine by coupling the fault trees of the components on the basis of a correlation between the input/output data of each component; a fault analysis unit that analyzes the fault of the machine on the basis of the abnormality degree and information of the fault tree of the entire machine; and a display unit that displays information analyzed by the fault analysis unit and issues an alarm.


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