The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Mar. 15, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Michael Howells, San Jose, CA (US);

Thorsten Kril, Santa Cruz, CA (US);

Hemanth Konanur Nagendra, Santa Clara, CA (US);

Jatinder Sasan, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/18 (2006.01); G05B 19/4155 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4155 (2013.01); G05B 19/182 (2013.01); G05B 2219/24015 (2013.01);
Abstract

An electronic device manufacturing system that includes a process tool and a tool server coupled to the process tool and comprising a communication node and an evaluation system. The communication node is configured to obtain one or more attributes from an evaluation system and provide a monitoring device comprising a data collection plan that is based on the one or more attributes. The communication node is further configured to register the monitoring device with a process tool. The communication node is further configured to receive, from the process tool, data based on the data collection plan and send the received data to the evaluation system.


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