The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Sep. 10, 2020
National University of Defense Technology, Hunan, CN;
Junjie Wu, Hunan, CN;
Yang Wang, Hunan, CN;
Xiaogang Qiang, Hunan, CN;
Ping Xu, Hunan, CN;
Jiangfang Ding, Hunan, CN;
Mingtang Deng, Hunan, CN;
Anqi Huang, Hunan, CN;
Xiang Fu, Hunan, CN;
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY, Hunan, CN;
Abstract
The present invention discloses a method for calibrating controllable phase shifters in a multi-stage staggered Mach-Zehnder interferometer structure on an optical chip, aiming to solve the problem of calibrating the controllable phase shifters in a configurable optical network of the multi-stage staggered Mach-Zehnder interferometers. The technical solution is to calibrate the controllable phase shifters that can be calibrated in the optical network; and then to constitute calibration conditions for and calibrate inner phase shifters that has not been; and finally to constitute calibration conditions for and calibrate outer phase shifters that is not calibrated.