The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Jun. 23, 2021
Applicant:
Institut National D'optique, Québec, CA;
Inventors:
Alex Paquet, Québec, CA;
François Berthiaume, Québec, CA;
Assignee:
INSTITUT NATIONAL D'OPTIQUE, Quebec, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01J 1/04 (2006.01); G01N 21/3581 (2014.01); G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
G02B 26/0883 (2013.01); G01J 1/0437 (2013.01); G01J 1/0448 (2013.01); G01J 1/0477 (2013.01); G01N 21/3581 (2013.01); G01N 21/552 (2013.01);
Abstract
Target devices for characterizing terahertz imaging systems are provided. The target devices include a terahertz resolution pattern having spatially distributed resolution features and one or more prism assemblies configured to provide a variable contrast level within the resolution features when used with terahertz radiation. Each prism assembly includes first and second prisms arranged in a Frustrated Total Internal Reflection (FTIR) configuration.