The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Nov. 04, 2021
Applicant:
Evident Corporation, Nagano, JP;
Inventor:
Yasuo Yonemaru, Tokyo, JP;
Assignee:
Evident Corporation, Nagano, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/364 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 7/00 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01);
Abstract
An image processing method includes: generating two images by performing two image enhancement processes for a microscopic image; and generating a corrected image obtained by compositing the two images, wherein the generating the two images includes generating a high-frequency enhanced image in which high-frequency components of the microscopic image are enhanced relative to low-frequency components of the microscopic image that have a lower frequency than the high-frequency components, and generating a microstructure enhanced image in which a microstructure in an observation sample included in the microscopic image is enhanced.