The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Mar. 11, 2020
Applicant:
Microvision, Inc., Redmond, WA (US);
Inventor:
Hanno Holzhüter, Hamburg, DE;
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/4865 (2020.01); G01S 17/931 (2020.01); G01S 17/10 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4866 (2013.01); G01S 17/10 (2013.01); G01S 17/931 (2020.01);
Abstract
A method for optical distance measurement is suggested which comprises executing at least one time-of-flight measurement, wherein a time-of-flight measurement comprises transmitting at least one measuring pulse by means of a transmission unit, reflecting at least one transmitted measuring pulse and receiving at least one reflected measuring pulse by means of a reception unit. The method further comprises generating a backscatter curve based on the time-of-flight measurement and evaluating the backscatter curve for object recognition.