The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Sep. 14, 2022
Applicant:
Pioneer Corporation, Tokyo, JP;
Inventors:
Takehiro Matsuda, Tokyo, JP;
Shogo Miyanabe, Tokyo, JP;
Assignee:
Pioneer Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/93 (2020.01); G01C 3/08 (2006.01); G01S 17/931 (2020.01); G01S 17/93 (2020.01);
U.S. Cl.
CPC ...
G01S 13/93 (2013.01); G01C 3/08 (2013.01); G01S 17/93 (2013.01); G01S 17/931 (2020.01);
Abstract
A measurement device () includes a measurement unit () which performs measurement by emitting electromagnetic waves and scanning an object with the electromagnetic waves, and a control unit () which controls the measurement unit (). The measurement unit () is operable in a first scan mode in which the object is scanned in a first direction, or a second scan mode in which the object is scanned in a second direction different from the first direction. The control unit () determines a scan mode to be executed by the measurement unit ().