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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11892428 B1

PDFFull Text
Date of Patent:
Feb. 06, 2024

Filed:

Apr. 18, 2018

Laser ablation device and analysis apparatus

Applicant:

S.t.japan Inc., Tokyo, JP;

Inventors:

Takao Nakagawa, Tokyo, JP;

Norio Yasuda, Tokyo, JP;

Assignee:

S.T.JAPAN INC., Tokyo, JP;

Attorney:

HAUPTMAN HAM, LLP

Primary Examiner:

Thien S Tran

Int. Cl.
CPC ...
G01N 27/623 (2021.01); B23K 26/0622 (2014.01); B23K 26/40 (2014.01); G01N 21/63 (2006.01); G01N 1/04 (2006.01); G01N 1/38 (2006.01); G01N 1/28 (2006.01); B23K 103/00 (2006.01); G01N 21/73 (2006.01);
U.S. Cl.
CPC ...
G01N 27/623 (2021.01); B23K 26/0624 (2015.10); B23K 26/40 (2013.01); G01N 1/04 (2013.01); G01N 1/286 (2013.01); G01N 1/38 (2013.01); G01N 21/63 (2013.01); B23K 2103/54 (2018.08); G01N 21/73 (2013.01); G01N 2001/045 (2013.01);
Abstract

A laser ablation device is provided with: a laser light source that outputs a femtosecond pulse laser beam; an optical system that includes a first mirror rotatable about a first axis, a second mirror rotatable about a second axis, a first driving source for rotating the first mirror about the first axis, and a second driving source for rotating the second mirror about the second axis, and that reflects the laser beam from the laser light source toward a sample by the first mirror and the second mirror; and an irradiation controller that, on the basis of the two-dimensional coordinate position of an analysis position, controls the first driving source and the second driving source to irradiate the analysis position with the laser beam.

Find Patent Forward Citations

Nakagawa, Takao. (2024). Laser ablation device and analysis apparatus (U.S. Patent No. 11892428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11892428

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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