The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Aug. 25, 2023
Applicant:
Airware, Inc., Newbury Park, CA (US);
Inventors:
Thomas G Campbell, Newbury Park, CA (US);
Jacob Y Wong, Goleta, CA (US);
Assignee:
AIRWARE, INC, Newbury Park, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); G01N 21/31 (2006.01); G01N 21/35 (2014.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01); G01N 21/3577 (2014.01); A61B 5/1455 (2006.01); G01N 21/21 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3151 (2013.01); A61B 5/0075 (2013.01); A61B 5/1451 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); G01N 21/3577 (2013.01); G01N 33/487 (2013.01); A61B 5/0062 (2013.01); A61B 2562/0238 (2013.01); G01N 21/21 (2013.01); G01N 33/49 (2013.01); G01N 2021/3148 (2013.01); G01N 2201/10 (2013.01);
Abstract
An absorption spectroscopy process uses a single radiation beam with two or more pulsed beams (including at least a signal beam and a reference beam) that are passed into a liquid sample to a variable effective depth and then reflected out of the liquid sample where it is detected and processed to obtain a value over a preselected time. As values are determined for multiple effective depths, a sampling dataset is obtained which is used to calculate a concentration level of a targeted particle in the liquid sample by use of calibration dataset obtained from use of known samples.