The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Apr. 24, 2020
Applicant:
New York University, New York, NY (US);
Inventors:
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G02B 21/00 (2006.01); G03H 1/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1475 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G02B 21/008 (2013.01); G02B 21/0056 (2013.01); G02B 21/0068 (2013.01); G03H 1/0005 (2013.01); G01N 15/1484 (2013.01); G01N 2015/003 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1445 (2013.01); G01N 2015/1454 (2013.01); G01N 2015/1493 (2013.01); G01N 2015/1497 (2013.01); G03H 2001/005 (2013.01);
Abstract
An in-line holographic microscope can be used to analyze on a frame-by-frame basis a video stream to track individual colloidal particles' three-dimensional motions. The system and method can provide real time nanometer resolution, and simultaneously measure particle sizes and refractive indexes. Through a combination of applying a combination of Lorenz-Mie analysis with selected hardware and software methods, this analysis can be carried out in near real time. An efficient particle identification methodology automates initial position estimation with sufficient accuracy to enable unattended holographic tracking and characterization.