The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Jan. 04, 2021
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Takuro Ideguchi, Tokyo, JP;

Kazuki Hashimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/453 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4535 (2013.01); G01J 3/021 (2013.01); G01J 3/0224 (2013.01); G01J 3/0297 (2013.01); G01J 3/18 (2013.01); G01J 2003/4534 (2013.01);
Abstract

In a Fourier-transform spectroscopy apparatus, a scanning mirror is arranged on a light path of scanning light. The scanning mirror delays or advances the scanning light with respect to reference light according to the rotational angle of the scanning mirror from its initial position. A spectroscopic spectrum generating unit generates an interferogram based on the intensity of the detection target light obtained from the detection target, and Fourier transforms the interferogram thus generated. The spectroscopic spectrum generating unit corrects the nonlinearity of the group delay between an envelope of the reference light and an envelope of the scanning light, and corrects the nonlinearity of the phase shift between the respective envelopes.


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