The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Jul. 17, 2020
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventor:

Jiazuo Zhang, London, GB;

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 18/22 (2023.01); E21B 43/00 (2006.01); G06N 20/20 (2019.01); G06F 17/16 (2006.01); G06F 18/2431 (2023.01);
U.S. Cl.
CPC ...
E21B 43/00 (2013.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01); G06F 18/22 (2023.01); G06F 18/2431 (2023.01); G06N 20/20 (2019.01);
Abstract

Disclosed embodiments include methods and systems for classifying test data. In one embodiment a method includes determining one or more variable types in a multivariate test vector within a data set, and for a plurality of machine-learning models, determining a closest match between variable types used by (to train) the machine-learning models and the determined variable types for the test vector. In response to determining a closest match for one machine-learning model, a corresponding machine-learning model is selected and the test vector is classified using the selected model. In response to determining a closest match for multiple machine-learning models, a similarity is determined between a probability distribution for the test data set and the probability distributions for the multiple machine-learning models to generate similarity values for each of the models. In response to one of the similarity values exceeding a threshold value, a machine-learning model is selected that corresponds to the exceeding similarity value and the test vector is classified using the selected model.


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