The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Dec. 17, 2020
Applicant:

Ut-battelle, Llc, Oak Ridge, TN (US);

Inventors:

James Haley, Oak Ridge, TN (US);

Ryan Dehoff, Oak Ridge, TN (US);

Vincent C. Paquit, Oak Ridge, TN (US);

Samuel C. Leach, Oak Ridge, TN (US);

Assignee:

UT-BATTELLE, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/153 (2017.01); B29C 64/386 (2017.01); G06T 7/80 (2017.01); B23K 26/03 (2006.01); G06T 7/40 (2017.01); G06T 7/73 (2017.01); G06T 7/00 (2017.01); B33Y 30/00 (2015.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/153 (2017.08); B23K 26/034 (2013.01); B29C 64/386 (2017.08); G06T 7/001 (2013.01); G06T 7/40 (2013.01); G06T 7/74 (2017.01); G06T 7/75 (2017.01); G06T 7/80 (2017.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12);
Abstract

A method and a system for digital image correlation and thermal monitoring during directed energy deposition are provided. The method and the system include global off-axis 3D mapping of surfaces features at high frame rates using the natural surface roughness of the additive build. Infrared thermography is projected onto these surface features to record the thermo-mechanical history of the finished component. As set forth herein, the method and the system provide a low-cost solution to monitoring and optimizing the unique temporal artifacts induced by complex scan strategies.


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