The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Feb. 14, 2020
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Alexandru Patriciu, Belmont, MA (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/37 (2017.01); G06T 7/70 (2017.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/587 (2013.01); A61B 6/4441 (2013.01); A61B 6/54 (2013.01); G01T 7/005 (2013.01); G06T 7/37 (2017.01); G06T 7/70 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Various embodiments of the present disclosure include a C-arm registration system employing a controller () for registering a C-arm () to an X-ray ripple marker () including a ripple pattern () radially extending from a fixed point () of the X-ray ripple marker (). In operation, the controller () identifies the ripple pattern () within an X-ray image generated from an X-ray projection by the C-arm () and illustrative of a portion or an entirety of the ripple pattern (), the identification of the ripple pattern () within the X-ray image is characteristic of a pose of the X-ray projection by the C-arm () relative to the X-ray rippler marker (). The controller () further analyzes the ripple pattern () within the X-ray image to derive one or more transformation parameters definitive of the pose of the X-ray projection by the C-arm () relative to the X-ray rippler marker (), and registers the C-arm () to the X-ray ripple marker () based on the transformation parameter(s).


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