The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Sep. 20, 2021
Accuray, Inc., Sunnyvale, CA (US);
Jacob Shea, Madison, WI (US);
Brandon Frederick, Raleigh, NC (US);
Eric Schnarr, McFarland, WI (US);
Daniel Gagnon, Twinsburg, OH (US);
Accuray, Inc., Sunnyvale, CA (US);
Abstract
A multimodal imaging apparatus, comprising a rotatable gantry system positioned at least partially around a patient support, a first source of radiation coupled to the rotatable gantry system, the first source of radiation configured for imaging radiation, a second source of radiation coupled to the rotatable gantry system, the second source of radiation configured for at least one of imaging radiation or therapeutic radiation, wherein the second source of radiation has an energy level more than the first source of radiation, and a second radiation detector coupled to the rotatable gantry system and positioned to receive radiation from the second source of radiation, and a processor configured to combine first measured projection data based on the radiation detected by the first detector with second measured projection data based on the radiation detected by the second detector, and reconstruct an image based on the combined data, wherein the reconstructing comprises at least one of correcting the second measured projection data using the first measured projection data, correcting the first measured projection data using the second projection data, and distinguishing different materials imaged in the combined data using the first measured projection data and the second measured projection.