The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
Dec. 30, 2016
Barco NV, Kortrijk, BE;
Tom Kimpe, Landegem, BE;
Frederik Toune, Bellem, BE;
Bart Diricx, Zedelgem, BE;
Elie DE Brauwer, Wetteren, BE;
Albert Xthona, Yamhill, OR (US);
Johanna Rousson, Saint Romain de Jalionas, FR;
Peter Nollet, Ghent, BE;
Tom Kimpe, Landegem, BE;
Frederik Toune, Bellem, BE;
Bart Diricx, Zedelgem, BE;
Elie De Brauwer, Wetteren, BE;
Albert Xthona, Yamhill, OR (US);
Johanna Rousson, Saint Romain de Jalionas, FR;
Peter Nollet, Ghent, BE;
BARCO NV, Kortrijk, BE;
Abstract
A dermatoscope or endoscope inspection device which can be calibrated at high accuracy to be able to focus at a certain depth, e.g. below the top surface of the skin. A calibration pattern is provided or can be located at a reference viewing surface of an inspection device such as a dermatoscope or endoscope. It is important for a dermatoscope to know with the best accuracy available at what absolute depth below the top of the skin the device is focused. The dermatoscope or endoscope inspection device includes focusing means and by knowing a relationship between a digital driving level which shifts the focus position of the focusing means and the corresponding absolute change in focus depth, it is possible to know how deep the device is focused in absolute terms below the top of the skin.