The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Aug. 17, 2020
Qualcomm Incorporated, San Diego, CA (US);
Jay King, San Diego, CA (US);
Alexander Dorosenco, El Cajon, CA (US);
Muhammad Sayed Khairy Abdelghaffar, San Jose, CA (US);
Joseph Binamira Soriaga, San Diego, CA (US);
Carl Hardin, Encinitas, CA (US);
Alexandros Manolakos, San Diego, CA (US);
James Krysl, San Diego, CA (US);
Michael Allen Kongelf, Los Altos Hills, CA (US);
Krishna Kiran Mukkavilli, San Diego, CA (US);
Tingfang Ji, San Diego, CA (US);
Joseph Patrick Burke, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
The transmission and reception group delay in a front end structure of a mobile device may be determined using closed loop calibration. The closed loop may be a near field radiated closed loop between pairs of antennas in an antenna array of the mobile device. The delay based on time of transmission and time of reception may be measured for a plurality of pairs of antennas, from which the transmit and receive group delay within a single path may be determined. The propagation delay of the signal between antennas may be included in the group delay calibration for increased accuracy. In another implementation, a conducted closed loop, e.g., in the transceiver or in a radio frequency switching network may be used to calibrate the group delay. Pre-characterization of the delay caused by components between the closed loop and antennas may be included in the group delay calibration for increased accuracy.