The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Aug. 30, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jueon Kim, Seoul, KR;

Taehyoung Kim, Singapore, SG;

Seungjin Park, Suwon-si, KR;

Jihwan Hyun, Hwaseong-si, KR;

Myoungbo Kwak, Seoul, KR;

Junghwan Choi, Hwaseong-si, KR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H04L 27/06 (2006.01); H03K 21/08 (2006.01); H03K 9/02 (2006.01); H04B 17/21 (2015.01); H03K 5/24 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03006 (2013.01); G01R 31/31703 (2013.01); H03K 5/24 (2013.01); H03K 9/02 (2013.01); H03K 21/08 (2013.01); H04B 17/21 (2015.01); H04L 27/06 (2013.01);
Abstract

An offset detector circuit includes a digital signal register storing M unit digital signals received in latest M signal periods, M being a natural number, among digital signals generated based on a single-ended PAM-N signal, N being an odd number, a comparator outputting a comparison signal of a pair of signals included in differential signals generated from a differential signal generator based on the single-ended PAM-N signal, a comparison result register storing M unit comparison signals corresponding to the latest M signal periods among the comparison signals, a pattern detector outputting a detection signal when the M unit digital signals match a predetermined signal pattern, and an offset checker checking patterns of the M unit comparison signals in response to the detection signal, and outputting an offset detection signal when the patterns of the M unit comparison signals match a predetermined offset pattern.


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