The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jun. 22, 2022
Applicant:

Lyft, Inc., San Francisco, CA (US);

Inventors:

Saurabh Bajaj, San Francisco, CA (US);

Davide Crapis, Berkeley, CA (US);

Eran Davidov, San Francisco, CA (US);

Omar Khalid, Redmond, WA (US);

Ehud Milo, San Mateo, CA (US);

Assignee:

Lyft, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/34 (2006.01); G08G 1/00 (2006.01); G06Q 50/30 (2012.01); G08G 1/123 (2006.01); H04W 4/30 (2018.01);
U.S. Cl.
CPC ...
G08G 1/202 (2013.01); G01C 21/3438 (2013.01); G06Q 50/30 (2013.01); G08G 1/123 (2013.01); G08G 1/205 (2013.01); H04W 4/30 (2018.02);
Abstract

The present application discloses an improved transportation matching system, and corresponding methods and computer-readable media. According to disclosed embodiments, a transportation matching system trains a predictive request model to generate a metric predicted to trigger an increase in transportation provider activity within the geographic area for a given time period. Furthermore, the system determines a predicted gap between expected request activity and expected transportation provider activity for the geographic area during a future time period, utilizes the predictive request model and the predicted gap to generate a metric for the geographic area, and generates an interactive map associated with a customized schedule for the geographic area and the future time period based on the generated metric.


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