The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Feb. 03, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Kazufumi Kobashi, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection apparatus comprises an obtaining unit configured to obtain first captured images of printed pages, a first setting unit configured to set an inspection region within a selected captured image selected from the first captured images of the respective pages obtained by the obtaining unit, and a second setting unit configured to perform setting performed on the selected captured image for the first captured image of a page decided based on a result of image analysis on the first captured images of the respective pages obtained by the obtaining unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile