The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

May. 24, 2023
Applicant:

Klaviyo, Inc, Boston, MA (US);

Inventor:

Ian Delbridge, Boston, MA (US);

Assignee:

Klaviyo, Inc, Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/00 (2023.01); G06Q 30/0242 (2023.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0243 (2013.01); G06N 5/04 (2013.01);
Abstract

Apparatuses, methods, and systems for determining winning arms of electronic testing. One method includes obtaining historical data related to the testing, creating a histogram based on the historical data, the histogram including bins and weights, creating a distribution by computing concentration parameters of the distribution from the weights of the histogram, executing the testing, receiving new data collected based on the execution of the test, allocating the new data into same bins as the bins of the histogram of the historical data yielding a new data bin count, computing a posterior distribution comprising updating the distribution using the same bins and the new data bin counts and the concentration parameters of the distribution in closed form vie conjugate prior formulae, inferring corresponding central tendencies of samplings of a metric distribution, constructing an overall utility distribution for each arms of the test, and determining a winning arm of the testing.


Find Patent Forward Citations

Delbridge, Ian. (2024). Determining winning arms of a/b electronic communication testing for a metric using historical data and histogram-based bayesian inference (U.S. Patent No. 11887149). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11887149

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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