The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Jul. 31, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Christopher Andrew Stephens, Issaquah, WA (US);
Alexander Clark Prater, Seattle, WA (US);
Alexander Michael McNamara, Seattle, WA (US);
Sridhar Boyapati, Sammamish, WA (US);
David Echevarria Ignacio, Seattle, WA (US);
David William Bettis, Seattle, WA (US);
Korwin Jon Smith, Seattle, WA (US);
Kevin Alexander Lee, Seattle, WA (US);
Aaron Craig Thompson, Seattle, WA (US);
Gary Paolo Raden, Seattle, WA (US);
Sudarshan Narasimha Raghavan, Snoqualmie, WA (US);
Dilip Kumar, Seattle, WA (US);
Félix Joseph Étienne Pageau, Seattle, WA (US);
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Abstract
A system may use sensor data from a facility to generate tentative values associated with an event, such as the identification of an item removed from a shelf of the facility. A confidence value associated with each of the tentative values may be less than a confidence threshold. In response, inquiry data seeking confirmation of a tentative value from an associate is generated and sent to one or more associates in the facility. Responses from the associates are collected to determine a selection of one of the tentative values. The selected tentative value is designated as output data for the system. Thereafter, the output data and the original sensor data are designated as training data, which can then be used to train or update machine learning systems. Subsequent use of the updated machine learning systems can yield more accurate results.