The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
May. 31, 2019
Georgetown University, Washington, DC (US);
David M. Hartley, Rockville, MD (US);
Nili S. Yossinger, Washington, DC (US);
Ophir Frieder, Washington, DC (US);
Georgetown University, Washington, DC (US);
Abstract
A hypotheses generation and event recognition system that enables event recognition by analyzing documents to construct one or more qualitative metrics (e.g., frequency of keywords, changes in sentiment, occurrence of ontological terms, evolution of topics, etc.), establishing a baseline for the qualitative metric(s), and outputting changes to that baseline for display. In aggregate, those qualitative metrics comprise temporal and/or spatial signals that, when combined, define signatures of events of interest. Accordingly, the user and/or the system may identify an event of interest based on the change in baseline. The system may further provide functionality to generate hypotheses by coding data according to an ontology, populating an ontology space, and using an optimization algorithm to rank points or neighborhoods in the coded ontology space. The system may further store links between ontological terms and qualitative metrics to provide functionality to test generated hypotheses that include those linked ontological terms.