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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11886954 B1

PDFFull Text
Date of Patent:
Jan. 30, 2024

Filed:

Dec. 31, 2020

Image analysis for mapping objects in an arrangement

Applicant:

Scandit Ag, Zurich, CH;

Inventors:

Fabian Nater, Zurich, CH;

Bernd Schoner, New York, NY (US);

Matthias Bloch, Zurich, CH;

Christian Floerkemeier, Zurich, CH;

Assignee:

Scandit AG, Zurich, CH;

Attorney:

Kilpatrick Townsend & Stockton LLP

Primary Examiner:

Christle I Marshall

Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06T 11/00 (2006.01); G06T 7/73 (2017.01); G06V 10/75 (2022.01); G06V 30/24 (2022.01); G06V 10/22 (2022.01); G06V 10/42 (2022.01); G06V 30/186 (2022.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06K 7/1443 (2013.01); G06K 7/1417 (2013.01); G06K 7/1447 (2013.01); G06T 7/73 (2017.01); G06T 11/00 (2013.01); G06V 10/225 (2022.01); G06V 10/42 (2022.01); G06V 10/751 (2022.01); G06V 30/186 (2022.01); G06V 30/19013 (2022.01); G06V 30/248 (2022.01);
Abstract

Image analysis is used to map objects in an arrangement. For example, images of a retail shelf are used to map items for sale on the retail shelf A first vector can used to identify a relative position of a first item on a shelf to a shelving diagram, and a second vector can be used to identify a relative position of a second on the shelf to the shelving diagram, using locations of optical codes (e.g., barcodes). Absolute positions can be calculated. In some configurations, multiple images having different fields of view are matched to an overview image.

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Quick Actions:

Nater, Fabian. (2024). Image analysis for mapping objects in an arrangement (U.S. Patent No. 11886954). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11886954

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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