The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Nov. 18, 2019
Applicants:
Thomas James Oetjens, Troy, MI (US);
Thomas Lorne Chartrand, Clarkston, MI (US);
Alexander Paul Oetjens, Troy, MI (US);
Inventors:
Thomas James Oetjens, Troy, MI (US);
Thomas Lorne Chartrand, Clarkston, MI (US);
Alexander Paul Oetjens, Troy, MI (US);
Assignee:
MAGNA INTERNATIONAL INC., Aurora, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/15 (2006.01); B21D 22/20 (2006.01); G01N 3/28 (2006.01); G06F 30/333 (2020.01); G06F 113/24 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); B21D 22/20 (2013.01); G01N 3/28 (2013.01); G06F 17/15 (2013.01); G06F 30/333 (2020.01); G06F 2113/24 (2020.01);
Abstract
A method for improving a hemispherical dome test includes calculating a forming limit diagram (FLD) based on a plurality of simulated data associated with a sheet metal transformation technique. The method also includes performing zero friction analysis on the sheet metal transformation technique. The method also includes shifting the FLD based on the zero friction analysis.