The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

May. 07, 2022
Applicant:

Fair Isaac Corporation, Roseville, MN (US);

Inventors:

Christopher Allan Ralph, Toronto, CA;

Gerald Fahner, Austin, TX (US);

Liang Meng, San Rafael, CA (US);

Assignee:

Fair Isaac Corporation, Minneapolis, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/9035 (2019.01); G06F 16/903 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9035 (2019.01); G06F 16/90335 (2019.01);
Abstract

A method, a system, and a computer program product for generating an interpretable set of features. One or more search parameters and one or more constraints on one or more search parameters for searching data received from one or more data sources are defined. The data received from one or more data sources is searched using the defined search parameters and constraints. One or more first features are extracted from the searched data. The first features are associated with one or more predictive score values. The searching is repeated in response to receiving a feedback data responsive to the extracted first features. One or more second features resulting from the repeated searching are generated.


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