The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Oct. 29, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Sunil Kittinakere Nagesh Koundinya, Newark, CA (US);

Ramakrishnan Hariharan Chandrasekharapuram, San Jose, CA (US);

Paul Ingram, Menlo Park, CA (US);

Assignee:

SPLUNK Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2474 (2019.01); G06F 16/22 (2019.01); G06F 16/2477 (2019.01);
Abstract

Described are systems, methods, and techniques for collecting, analyzing, processing, and storing time series data and for evaluating and determining whether and how to include late or delayed data points when publishing or storing the time series data. Maximum delay values can identify a duration for waiting for late or delayed data, such as prior to publication. In some examples, maximum delay values can be dynamically adjustable based on a statistical evaluation process. For late or delayed data points that are received after the maximum delay elapses, some data points can be included in the stored time series data, such as if they are received in the same order that they are generated.


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