The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Feb. 13, 2023
Applicant:

Veeva Systems Inc., Pleasanton, CA (US);

Inventors:

Zhen Tan, North York, CA;

Marius K. Mortensen, Burlington, CA;

Piotr Kuchnio, Toronto, CA;

Prashant Raghav, Toronto, CA;

Shanul Srivastava, Brampton, CA;

Assignee:

Veeva Systems Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 16/21 (2019.01); G06F 16/242 (2019.01); G06F 16/2457 (2019.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06F 16/215 (2019.01); G06F 16/219 (2019.01); G06F 16/2445 (2019.01); G06F 16/24573 (2019.01);
Abstract

Systems and methods are provided for using point-in-time architecture (PTA) databases. An exemplary method includes: entering first data, received from a first data source, into a first PTA database; receiving a first instruction to process the first data using a first statistical operation; executing the first statistical operation for the first data, resulting in first output data; filtering the first output data based on a user-selected attribute; and performing multiple stages of a data processing operation for the first output data.


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