The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Oct. 28, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Takuya Iwatsuka, Tokyo, JP;

Haruto Tanno, Tokyo, JP;

Toshiyuki Kurabayashi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/455 (2018.01); G06F 21/57 (2013.01); G06F 9/445 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract

A test information extraction device improves efficiency in testing applications by including: an obtainment unit that obtains, from a first source code group of an application that implements methods corresponding to requests of a plurality of types received via a network, first information used for generating the requests; and an extraction unit that specifies, from among the methods implemented in response to the requests, a method being a caller of a method included in a second source code group being a part of the first source code group and that further extracts, from the first information, second information used for generating one of the requests corresponding to the specified method.


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