The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Nov. 15, 2021
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Del Myers, Seattle, WA (US);
William Xie, Sammamish, WA (US);
Mark Anthony Jelf Downie, Hilliard, OH (US);
Joseph Mark Schmitt, Seattle, WA (US);
Justin Michael Anderson, Dublin, CA (US);
Gregory Bernard Miskelly, Seattle, WA (US);
Claudiu-Constantin Guiman, Brooklyn, NY (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Methods, systems, and computer program products for using a confidence measure to automatically identify a diagnostic analyzer that applies to a diagnostic artifact. A plurality of diagnostic analyzers are each configured to analyze diagnostic artifacts relating to prior executions of software entities. A confidence measure is calculated for each diagnostic analyzer. Each confidence measure indicates a likelihood that the diagnostic analyzer applies to a particular diagnostic artifact. Calculating each confidence measure comprises applying one or more heuristics specific to the diagnostic analyzer against the particular diagnostic artifact, with an outcome of application of each heuristic contributing to the confidence measure for the respective diagnostic analyzer. Based at least on calculating the confidence measure for each diagnostic analyzer, and based on one or more determined thresholds, it is determined whether to include each diagnostic analyzers in a set of diagnostic analyzers with which to analyze the particular diagnostic artifact.