The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Jun. 17, 2022
Ebay Inc., San Jose, CA (US);
Maxwell Henry Poole, San Jose, CA (US);
Satish Sambasivan, Cupertino, CA (US);
Vivek Siva Kaushik, Pleasanton, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.