The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
May. 26, 2021
Applicant:
Nuro, Inc., Mountain View, CA (US);
Inventor:
Sreeja Nag, Mountain View, CA (US);
Assignee:
NURO, INC., Mountain View, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/02 (2020.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G05D 1/0214 (2013.01); G05D 1/0088 (2013.01); G05D 1/0219 (2013.01); G05D 1/0276 (2013.01); G05D 2201/0213 (2013.01);
Abstract
According to one aspect, a method is provided to determine whether an autonomous system is ready to be deployed or is otherwise ready for use, scene-based metrics, or metrics based on instances of scenarios. Scene-based metrics are mapped, or otherwise translated, to distance-based metrics such that substantially standard distance-based metrics may be used to gate the readiness of an autonomy system for deployment.
Quick Actions:
Nag, Sreeja. (2024). Methods and apparatus for using scene-based metrics to gate readiness of autonomous systems (U.S. Patent No. 11886193). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11886193
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile