The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Mar. 02, 2022
Applicant:

Claritrics Inc., New York, NY (US);

Inventors:

Praveen Kumar Suresh, Salem, IN;

Sriram Rajkumar, Chennai, IN;

Sudarsun Santhiappan, Chennai, IN;

Assignee:

CLARITRICS INC., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G05B 19/4183 (2013.01); G05B 19/4188 (2013.01); G05B 19/41885 (2013.01);
Abstract

The present disclosure describes a method, system, and computer readable medium for facilitating predictive maintenance of testing machine using a combination of deep learning. The method comprises performing receiving plurality of tested data of a plurality of products being tested by the testing machine. The method further comprises applying a predictive model, having predictive model parameters, upon the plurality of tested data to predict a plurality of future test data corresponding to the plurality of products. The method further comprises determine a deviation between the plurality of tested data and the plurality of future test data, wherein the deviation indicates fault in the testing machine. The method further comprises determine a fault level of the testing machine by comparing the deviation with a predefined threshold and determining, during run-time, the maintenance required for the testing machine based on the fault level.


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