The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Jul. 30, 2019
Essenlix Corporation, Monmouth Junction, NJ (US);
Stephen Y. Chou, Princeton, NJ (US);
Wei Ding, East Windsor, NJ (US);
Ji Qi, Hillsborough, NJ (US);
Yuecheng Zhang, Yardley, PA (US);
Wu Chou, Basking Ridge, NJ (US);
Mingquan Wu, Princeton Junction, NJ (US);
Xing Li, Metuchen, NJ (US);
Jun Tian, Belle Mead, NJ (US);
Essenlix Corporation, Monmouth Junction, NJ (US);
Abstract
A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.