The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Jan. 25, 2019
University of Washington, Seattle, WA (US);
Adam K. Glaser, Seattle, WA (US);
Jonathan T. C. Liu, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
Embodiments disclosed herein directed to multi-direction digital light sheet microscopy (mDSLM). In mDSLM a sample may be illuminated with an illumination sheet which has a first angular diversity along a first axis and a second angular diversity along a second axis which is orthogonal to the first axis. An mDSLM system includes beam shaping optics which may passively reshape light into the illumination sheet. In some embodiments, scanning optics may be used to scan the illumination sheet with respect to the sample. In some embodiments, a confocal aperture may be used to limit out of focus light which reaches a detector of the mDSLM system.