The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jun. 16, 2022
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Jin Ma, Houston, TX (US);

Clint Lozinsky, Kingwood, TX (US);

Hsu-Hsiang Wu, Sugar Land, TX (US);

Li Pan, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/30 (2006.01); E21B 49/00 (2006.01);
U.S. Cl.
CPC ...
G01V 3/30 (2013.01); E21B 49/00 (2013.01); E21B 2200/20 (2020.05);
Abstract

A system and method for evaluating a subterranean formation includes a logging tool that includes transmitter and receiver antennae. The transmitter antenna transmits a first electromagnetic signal into the formation at a plurality of depths. The receiver antenna receives a plurality of second electromagnetic signals emitted by the formation in response to the first signal. The system and method also include a processor configured to calculate resistivity values for the second signals, calculate solutions to an inversion algorithm of the formation, filter the solutions into a plurality of convergent solutions, pixilate the convergent solutions into pixilated solutions, calculate ensemble statistics for the pixilated solutions, calculate a difference in resistivity value between successive pixels, identify presumptive layer boundaries based on the differences in resistivity values, calculate composite resistivity statistics from the pixilated solutions based on the presumptive layer boundaries and the ensemble statistics, and generate a formation model.


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