The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jun. 09, 2022
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Dominik Paul, Bubenreuth, DE;

Hans-Peter Fautz, Forchheim, DE;

Mario Zeller, Erlangen, DE;

David Grodzki, Erlangen, DE;

Hannah Hale, Buckenhof, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); G01R 33/56 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); G01R 33/565 (2013.01); G01R 33/5608 (2013.01);
Abstract

In a computer-implemented method for setting a field of view for a magnetic resonance scan, exclusion information describing a region of the original field of view that is unmapped owing to the distortion is ascertained on the basis of the distortion map for at least one first set of field-of-view parameters describing a rectangular or cuboidal original field of view, the exclusion information is used to determine a second set of field-of-view parameters to be used for the magnetic resonance scan, and the magnetic resonance scan is performed using the second set of field-of-view parameters.


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